Article 11317

Title of the article

MODELING OF DATA STORAGE RELIABILITY IN DYNAMIC MEMORY MICROCIRCUITS
IN MATLAB/SIMULINK ENVIRONMENT  

Authors

Khomutov Konstantin Igorevich, master degree student, Institute of Radioelectronics and Information Technologies – RTF, Ural Federal University named after the first President of Russia B. N. Yeltsin (620002, 32 Mira street, Ekaterinburg, Russia),a.a.shegal@ urfu.ru
Shegal Anna Ayzikovna, candidate of technical sciences, associate professor, sub-department of radio electronics and communications, Institute of Radioelectronics and Information Technologies – RTF, Ural Federal University named after the first President of Russia B. N. Yeltsin (620002, 32 Mira street, Ekaterinburg, Russia), a.a.shegal@ urfu.ru
Iofin Alexander Aronovich, candidate of technical sciences, deputy chief designer, JSC «Ural Design Bureau «Detal» (623409, 8 Pionerskaya street, Kamensk-Uralsky, Sverdlovsk Region, Russia), tehdep630@yandex.ru
Ivanov Vyacheslav Elizbarovich, doctor of technical sciences, professor, sub-department of Radio electronics and communications, Institute of Radioelectronics and Information Technologies – RTF, Ural Federal University named after the first President of Russia B. N. Yeltsin (620002, 32 Mira street, Ekaterinburg, Russia), v.e.ivanov@urfu.ru

Index UDK

621.396

DOI

10.21685/2307-4205-2017-3-11

Abstract

It is shown that, when examining the characteristics of the storage of information in dynamic memory chips based on the sale of computer memory widely used software Matlab/Simulink. Batch Simulink is an integral part of the MATLAB simulation systems and comes along with it. The basis of his work is visually-oriented programming principles using models presented in the form of blocks, structured by sections of the library. The problem with the help of specialized units to build a model cell byte Simulink dynamic memory running under conditions of natural background radiation and a comparative analysis of noise in the absence of data storage and Use redundant code Hamming. First model of dynamic memory cells on natural background radiation and the influence of noise on reliability of Hamming code information. The proposed model is used to study the work of controlling the test work RAM, as well as the impact of elevated radiation levels, especially in outer space on dynamic reliability of memory chips.

Key words

reliability, modeling, dynamicmemory cell, Matlab / Simulink, error – correctional coding, radiation background

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Дата создания: 20.11.2017 10:49
Дата обновления: 21.11.2017 15:33